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PLRD-83-20 1 (1982-11-29)

handle is hein.gao/gaobabmxj0001 and id is 1 raw text is: 

                     UNITED STATES GENERAL ACCOUNTING OFFICE
            'K.
                             WASHINGTON, D.C. 20548IZI 2


PROCUREMENT. LOGISTICS.
AND READINESS DIVISION
                                                     t2

The Honorable Richard D. DeLauer
The Under Secretary of Defense
   (Research and Engineering)

Dear Dr. DeLauer:

     Subject:  GAO Review on High Reliability Electronic         00
               Parts Testing and Data Requirements:
               (GAO/PLRD-83-20)                  I......

     We made a limited review of high reliability electronic
parts testing and data requirements under the Department of
Defense (DOD) standardization and specification program. We
made this review because officials of a company that manufac-
tures military electronic equipment expressed the view that
DOD could significantly reduce its cost for electronic systems.
These officials believed that DOD's requirement for a large
number of different tests and data could be reduced by using
electronic parts manufactured to a few well-defined reliability
levels based on end use.

     During our review, we attempted to (1) identify the same
or similar parts having different test and data requirements,
(2) identify the associated costs for such tests and data
requirements, and (3) calculate the potential savings resulting
from applying a single set of tests. We interviewed officials
in 16 DOD, civilian agency, and private sector organizations,
including DOD contractors, industry associations, an independent
test laboratory, and a microcircuit manufacturer. We also
reviewed available research and technical reports and examined
a variety of DOD and private sector documentation. We limited
our efforts to four groups of electronic parts--microcircuits,
semiconductors, capacitors, and resistors--and placed emphasis
on microcircuits because they were the most costly, complex,
and troublesome of the four groups.

     We were unable to obtain the information needed to identify
 significant numbers of the same or similar parts with different
 test and data requirements or the associated costs for such tests
 and data requirements. However, the information we were able to
 obtain through interviews with various officials and from an
 examination of documents that were readily available convinced us
 that there are difficulties with the standardization and specifi-
 cation program in the electronic parts area, specifi~cally with
 the four family groups included in our review. Although we did
 not make a detailed review, we believe that DOD could use the


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